JPH0439886B2 - - Google Patents

Info

Publication number
JPH0439886B2
JPH0439886B2 JP3584186A JP3584186A JPH0439886B2 JP H0439886 B2 JPH0439886 B2 JP H0439886B2 JP 3584186 A JP3584186 A JP 3584186A JP 3584186 A JP3584186 A JP 3584186A JP H0439886 B2 JPH0439886 B2 JP H0439886B2
Authority
JP
Japan
Prior art keywords
hologram
light
wavefronts
phase
film thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3584186A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62192604A (ja
Inventor
Joji Matsuda
Michio Namiki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP3584186A priority Critical patent/JPS62192604A/ja
Publication of JPS62192604A publication Critical patent/JPS62192604A/ja
Publication of JPH0439886B2 publication Critical patent/JPH0439886B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
JP3584186A 1986-02-20 1986-02-20 シアリング干渉コントラスト法膜厚測定装置 Granted JPS62192604A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3584186A JPS62192604A (ja) 1986-02-20 1986-02-20 シアリング干渉コントラスト法膜厚測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3584186A JPS62192604A (ja) 1986-02-20 1986-02-20 シアリング干渉コントラスト法膜厚測定装置

Publications (2)

Publication Number Publication Date
JPS62192604A JPS62192604A (ja) 1987-08-24
JPH0439886B2 true JPH0439886B2 (en]) 1992-07-01

Family

ID=12453200

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3584186A Granted JPS62192604A (ja) 1986-02-20 1986-02-20 シアリング干渉コントラスト法膜厚測定装置

Country Status (1)

Country Link
JP (1) JPS62192604A (en])

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0781818B2 (ja) * 1991-12-11 1995-09-06 工業技術院長 レンズ横収差測定用シアリング干渉計
JP6817642B2 (ja) 2016-08-24 2021-01-20 公立大学法人兵庫県立大学 エリプソメトリ装置およびエリプソメトリ方法

Also Published As

Publication number Publication date
JPS62192604A (ja) 1987-08-24

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term